Publication:
Deep Learning-Based Classification of Software Bugs Using Code Context and AST Features

Loading...
Thumbnail Image

Date

Institution Authors

Item type:Person,
ARŞIK, ARDA
Arş.Gör.
Item type:Person,
AKBULUT, AKHAN
Doç.Dr.

Organizational Units

Advisor

item.page.editor

Editor

Department

Journal Title

Journal ISSN

Volume Title

Publisher

DOI

10.15672/hujms.1386151

Research Projects

Organizational Units

Journal Issue

Abstract

A software component plagued with bugs is likely to experience both functional and non-functional difficulties, such as usability, performance, and security issues. These bugs can range from improper layouts to system crashes and security vulnerabilities. In this research, we developed a deep learning-based model to classify software bugs based on preceding and corrected code statements. Preprocessing includes extracting features from the Abstract Syntax Tree (AST) by traversing the tree to capture node types and relationships, then encoding the AST into a numerical vector representation for classification. Using AST and padding methods, features are extracted from code statements for use in a Convolutional Neural Network (CNN) model. We proposed a CNN-based model with AST-based feature extraction for large-scale software bug classification and evaluated on 153,652 bug samples from 1,000 GitHub projects. Compared to traditional datasets, this large dataset presents challenges in building accurate prediction models. This model is particularly useful in continuous integration (CI) pipelines, where it can automatically detect problematic code during the build process, helping to identify bugs faster and reduce manual review.

Description

Journal or Series

ISSN

ISBN

979-833150993-4

Rights

info:eu-repo/semantics/restrictedAccess

Citation

Gokcen, A., Arsik, A., Akbulut, A., & Catal, C. (2025, April). Deep Learning-Based Classification of Software Bugs Using Code Context and AST Features. In 2025 13th International Symposium on Digital Forensics and Security (ISDFS) (pp. 1-5). IEEE.

Endorsement

Review

Supplemented By

Referenced By

Related Patent

Related Goal

28
Görüntülenme
0
İndirme
Altmetric
Dimensions
PlumX Metrikleri
BIP! Indicators
Google Scholar
Scholar'da Ara ↗