Now showing items 1-1 of 1

    • Dielectric and Raman spectroscopy of TlSe thin films 

      Özel, Ayşen E.; Değer, Deniz; Çelik, Sefa; Şahin, Yakut; Karabak, Binnur; Akyüz, Sevim; Ulutaş, Hulusi Kemal (Elsevier Science Bv, Po Box 211, 1000 AE Amsterdam, Netherlands, 2017-12-15)
      In this report, the results of Dielectric and Raman spectroscopy of TlSe thin films are presented. The films were deposited in different thicknesses ranging from 290 angstrom to 3200 angstrom by thermal evaporation method. ...