Publication:
Deep Learning-Based Defect Prediction for Mobile Applications

dc.contributor.authorJORAYEVA, MANZURA
dc.contributor.authorAKBULUT, AKHAN
dc.contributor.authorÇatal, Çağatay
dc.contributor.authorMishra, Alok
dc.date.accessioned2023-03-22T13:49:45Z
dc.date.available2023-03-22T13:49:45Z
dc.date.issued2022
dc.description.abstractSmartphones have enabled the widespread use of mobile applications. However, there are unrecognized defects of mobile applications that can affect businesses due to a negative user experience. To avoid this, the defects of applications should be detected and removed before release. This study aims to develop a defect prediction model for mobile applications. We performed cross-project and within-project experiments and also used deep learning algorithms, such as convolutional neural networks (CNN) and long short term memory (LSTM) to develop a defect prediction model for Android-based applications. Based on our within-project experimental results, the CNN-based model provides the best performance for mobile application defect prediction with a 0.933 average area under ROC curve (AUC) value. For cross-project mobile application defect prediction, there is still room for improvement when deep learning algorithms are preferred.en
dc.description.sponsorshipMolde University College-Specialized Univ. in Logistics, Norway
dc.identifier22
dc.identifier.citationJorayeva M, Akbulut A, Catal C, Mishra A. Deep Learning-Based Defect Prediction for Mobile Applications. Sensors. 2022; 22(13):4734. https://doi.org/10.3390/s22134734
dc.identifier.eissn2319-6440
dc.identifier.pubmed35808230
dc.identifier.scopus2-s2.0-85132376127
dc.identifier.urihttps://doi.org/10.3390/s22134734
dc.identifier.urihttps://hdl.handle.net/11413/8395
dc.identifier.wos000823471600001
dc.language.isoen
dc.publisherMPDI
dc.relation.journalSensors
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rightsAttribution-NoDerivs 3.0 United Statesen
dc.rights.urihttp://creativecommons.org/licenses/by-nd/3.0/us/
dc.subjectSoftware Defect Prediction
dc.subjectSoftware Fault Prediction
dc.subjectMobile Application
dc.subjectAndroid Applications
dc.subjectDeep Learning
dc.subjectMachine Learning
dc.titleDeep Learning-Based Defect Prediction for Mobile Applicationsen
dc.typeArticle
dspace.entity.typePublication
local.indexed.atwos
local.indexed.atpubmed
local.indexed.atscopus
local.journal.endpage18
local.journal.issue13
local.journal.startpage1
relation.isAuthorOfPublication6ee0b32b-faed-495d-ac4d-8a263d1ff889
relation.isAuthorOfPublication.latestForDiscovery6ee0b32b-faed-495d-ac4d-8a263d1ff889

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Tam Metin/Full Text
Size:
2.88 MB
Format:
Adobe Portable Document Format

License bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
1.82 KB
Format:
Item-specific license agreed upon to submission
Description: